Accelerated Reliability Solutions, L.L.C.

Accelerated Reliability Solutions provides electronics and electro-mechanical systems design companies and manufacturers the most efficient and effective reliability development strategy, tools, methods, and solutions to rapidly discovering the causes and preventing flaws from getting to your customers.We offer training and seminars on shorter more comprehensive testing using inherent strength in electronics systems


 
 

From Semiconductor Fabrication to Electronic Systems

 

Over 3 Decades of experience in Electronics Manufacturing and Testing  



The founder and Principal Consultant, Kirk Gray,  has over thirty two years of experience in the electronics manufacturing industry.  Mr. Gray began his career in electronics at the semiconductor fabrication process level,  followed the path of the  manufacturing process to larger systems, and improving the efficiency of latent defect testing for reliability during of subsystem and system level personal computer (PC)  development.


Beginning his career as a field engineer for Accelerators Inc. and Veeco Instruments from 1977 to 1982, he installed and serviced, Ion Implantation and many other other high vacuum thin-film deposition and etching systems used in semiconductor fabrication. Later, as a Sales Engineer for Veeco Instruments and CVC from 1982 through 1986, he worked with semiconductor process engineers to solve thin-film application and etching process issues and equipment applications

 

As the Environmental Stress Screening (ESS) Process Engineering Manager in manufacturing test at Storage Technology from 1989 to 1992, he worked closely with Gregg K. Hobbs, PhD., P.E., the inventor of the terms and techniques of Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS) .  Mr. Gray's ESS process engineering team applied the HALT and HASS process and procedures into existing manufacturing production of data storage systems.

 

In the spring of 1992 in Vancouver, Washington, Mr. Gray was an invited speaker to the first Institute of Environmental (IES) Workshop on Environmental Stress Screening of Electronic Hardware. He presented a seminar and paper on "Stress Screen Design" at StorageTek using HALT and HASS.

 

In 1992 to 1993 he again had the opportunity work with Dr. Gregg Hobbs, at the company Gregg founded, Qualmark. Qualmark is a manufacturer of HALT and HASS chambers. While there he helped customers with HALT and HASS  application methods, and performed many HALT and HASS tests for customers. 

 

In 1994 he formed AcceleRel Engineering, Inc. a consulting company. He led a wide variety of electronic companies including the bio-medical, telecommunications, power supply, and other electronic systems producers, to methods of HALT and HASS and rapidly improving reliability of electronic and electro-mechanical hardware. He has been invited worldwide to  teach and consult HALT ahd HASS and the Physics-of-Failure (PoF) approach to reliability. These methods focus on the operational limits and failure modes and the root physical causes for these boundaries in order to develop faster reliability assurance test. Mr. Gray has help plan,  directed  testing, developed test fixtures, optimized accelerated stress screen thermal cycling, analyzed test data, and guided investigation to adoption of the new paradigm of limit testing for rapid reliability development. He also conducted failure analysis of assemblies and components to root-cause. Mr. Gray has documented results of reduced warranty return rates from 5% to 0.5% after new test processes were applied. With this 90% reduction in warranty returns, reliability testing was reduced from 72 hours to one (1) hour. Developed recommendations for maintenance and improvement of accelerated reliability screening methods for continued production test time improvement.


From 2003 until 2010 Mr. Gray was a Sr. Test Engineer in Reliability Development and Accelerated Stress Testing (AST) specialist at Dell, Inc. where he developed new accelerated stress test processes for desktop,  portable computers, and servers. He introduced and developed the Highly Accelerated Stress Audits (HASA) for power supplies. These new processes for Dell, rapidly found manufacturing excursions before shipment.  The power supply  HASA process was recognized as the highest ROI (return on investment) of all Dell Ongoing Reliability Testing (ORT) processes.He gave internal classes at Dell on Accelerated Stress Testing, reviewed HALT and HASS equipment qualification.


He currently is also a Senior Collaborator with The University of Maryland CALCE (Center for Advanced Life Cycle Engineering).

 

Mr. Gray is the Past Chairman  of the Denver Chapter of the IEEE Reliability Society (1997-1999).

 

He is a charter member, past Chairman, and current General Chair of the IEEE/CPMT Technical Committee on Accelerated Stress Testing and Reliability (ASTR) .  


He  is a Senior Member of the IEEE and  earned a Bachelor of Science degree in Electrical Engineering from the University of Texas at Austin in1982.



Recommendations:

 

"I first worked and met Kirk when Dell was introducing an ORT program with their PSU suppliers. Kirk lead this HASA program from a technical perspective and educated the suppliers and Dell personal. Once the program was up and running Kirk was always the go to person for advice / direction or how to better this program. Kirk is passionate about reliability but is also aware of business needs and ensured cost was always considered." June 22, 2010

Philip Hackett, WW Quality Manager , Dell

 

"I have enjoyed working with Kirk on projects pertaining to reliability issues observed in the field. Kirk has a unique perspective on reliability. Kirk applied stress methods that reproduced a field failure mode, as reported by the customer, on field returned units after the systems were declared CND or NFF after days of conventional testing and FA." June 19, 2010

Nikhil Vichare, Advanced Engineering , Dell


 

"Kirk is truly a subject matter expert in the theory, implementation and application of HALT/HASS/HASA. His professionalism and dedication were outstanding. Kirk has a major impact on the reliability of Dell products through in-house and supplier application of these techniques." April 6, 2006

Harold Melton, Reliability Engineering Mgr. , Dell

To discuss your reliability questions or Schedule Seminars and Consulting contact us:

Email: kirk@acceleratedreliabilitysolutions.com

Or contact us at:

Call or Text: 512-554-3111


Mailing address:

Accelerated Reliability Solutions, L.L.C.

1115 Nottingham St.

Lafayette, Colorado 80026